On the mutual capacitance and inductance of a shielded interconnect four-line system
نویسنده
چکیده
In this paper, the capacitance and inductance of a four-line transmission structure is characterized. The procedure used was developed by Ymeri et al for general analysis of multilayer multiconductor interconnects for specific applications in microelectronics. The characterization is based on the determination of the quasi-static electric scalar potential in the structure making up the four-line interconnect. Using the electric potential, the mutual capacitances and inductances are found. The characterization of the four-conductor structure is significantly different from the simple conductor pair because the symmetry of the pair is lost. A number of numerical results are calculated and presented.
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